https://research.ibm.com/publications/magnetoresistive-random-access-memory-mram-and-reliability--2
Magnetoresistive random access memory (MRAM) and reliability for IIRW 2003 - IBM Research
Magnetoresistive random access memory (MRAM) and reliability for IIRW 2003 by B. Hughes
random access memory
https://research.ibm.com/publications/relationship-between-interfacial-adhesion-and-electromigration-in-cu-metallization--1
Relationship between interfacial adhesion and electromigration in Cu metallization for IIRW 2002 -...
Relationship between interfacial adhesion and electromigration in Cu metallization for IIRW 2002 by J.R. Lloyd et al.