https://repository.lib.ncsu.edu/items/6586c8de-6803-424b-85cd-5683e2c8f4bb
Electron Transport in Bulk-Si NMOSFETs in Presence of High-k Insulator-charge Trapping and Mobility
Recent advancements in gate stack engineering has led to the development of aggressively scaled, high mobility, high-k dielectric based NMOSFETs with metal...
https://nrc-publications.canada.ca/eng/view/object/?id=fad93cc5-71ce-4716-92fe-2ed71f52b4dd
Very Low Noise RF nMOSFETs on Plastic by Substrate Thinning and Wafer Transfer - NRC Publications...
Very Low Noise RF nMOSFETs on Plastic by Substrate Thinning and Wafer Transfer
https://scholars.lib.ntu.edu.tw/entities/publication/6991ae43-ffcf-4ef8-8987-b3769c73f558
Improvement of hot-carrier resistance and radiation hardness of nMOSFETs by irradiation-then-anneal...
The improvement of hot-carrier resistance and radiation hardness in n-channel MOSFETs by a novel technique is studied. This technique includes a Co-60 (1 M...
https://www.img.ufl.edu/publication/1319/total-ionizing-dose-effects-strained-hfo2-based-nmosfets
Total Ionizing Dose Effects on Strained HfO2-based nMOSFETs | Interdisciplinary Microsystems Group...