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https://iris.unimol.it/handle/11695/153794
The Mu2e Digitizer ReAdout Controller (DiRAC): Characterization and radiation hardness
digitizer
readout
controller
dirac
characterization
https://iris.unical.it/handle/20.500.11770/167347
Wafer Level Statistical Evaluation of the Proton Radiation Hardness of a High-k Dielectric/Metal...
https://agenda.infn.it/event/6120/contributions/61798/author/79230
RD13 - 11th International Conference on Large Scale Applications and Radiation Hardness of...
Large semiconductor systems for calorimetry and tracking applications; radiation damage measurements and modeling; radiation hardness of semiconductor...
international conference
large scale