https://www.arxiv.org/abs/1401.6217
Abstract page for arXiv paper 1401.6217: A posteriori analysis of low-pass spatial filters for approximate deconvolution large eddy simulations of homogeneous...
a posteriorilow passspatial filtersanalysis
https://www.nist.gov/publications/posteriori-error-estimate-scanning-electron-microscope-simulation-adaptive-mesh
The intensity variation in a scanning electron microscope is a complex function of sample topography and composition.
scanning electron microscopeerrorestimatesimulation