Robuta

https://www.nist.gov/publications/laser-assisted-atom-probe-tomography-titin-films-deposited-si
Laser-assisted atom probe tomography (L-APT) was used to examine superconducting TiN/Ti/TiN trilayer films with nominal respective thicknesses of 5/5/5 (nm).
atom probe tomographylaserassistedtifilms
https://www.nist.gov/publications/extreme-ultraviolet-radiation-pulsed-atom-probe-tomography-iii-nitride-semiconductor
extreme ultraviolet radiationatom probe tomographyiiinitride