https://uwspace.uwaterloo.ca/items/016aaafa-7f56-4aee-9cd5-68720bda33a3
Simplifying Accelerated Electromigration Testing of Solder using Wire-based DUTs
A novel and accelerated method for the characterization of Electromigration (EM) in a solder material typically used in electronics packaging is proposed in...
simplifyingacceleratedtestingsolderusing