https://www.nist.gov/publications/gaas-buffer-layer-morphology-and-lateral-distributions-ingaas-quantum-dots
Atomic force microscopy was used to study the morphology of GaAs buffer layers and the density and height distributions of self-assembled InGaAs quantum dots (Q
gaasbufferlayermorphologylateral
https://www.novuslight.com/new-swir-ingaas-line-scan-sensor-for-high-speed-industrial-inspection_N13526.html
high speednewswiringaasline