https://nrc-digital-repository.canada.ca/eng/view/object/?id=96e5518f-f7c3-49d4-8101-8db2051181b1
Metrology Standards 002 - NRC Digital Repository - Canada.ca
Metrology Standards 002
metrology standardsdigital repositorynrccanada
https://www.nist.gov/publications/thickness-and-composition-reference-standards-semiconductor-metrology
Thickness and Composition Reference Standards for Semiconductor Metrology | NIST
Sep 29, 2025 - This report from the MET16 project describes tests of X-ray reflectometry (XRR), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and atom probe
reference standardssemiconductor metrologythicknesscompositionnist
https://nrc.canada.ca/en/stories/taylor-spengen-ionizing-radiation-standards-metrology-research-centre
Taylor Spengen, Ionizing radiation standards, Metrology Research Centre - National Research Council...
ionizing radiationresearch centretaylorstandardsmetrology
https://www.nist.gov/publications/standards-radium-226-marie-curie-international-committee-radionuclide-metrology
Standards of Radium-226: From Marie Curie to the International Committee for Radionuclide Metrology...