https://www.electronicdesign.com/technologies/test-measurement/article/21807411/twin-dft-and-mission-critical-safety-apps-for-pre-silicon-design-verification
Twin DFT and Mission-Critical Safety Apps for Pre-Silicon Design Verification | Electronic Design
Combining these Apps with an emulation environment makes it possible to increase fault coverage, increase production yield, and reduce ATE test time and cost.