https://www.osti.gov/pages/biblio/1490907-extending-depth-field-ptychography-using-complex-valued-wavelets
The U.S. Department of Energy's Office of Scientific and Technical Information
extendingdepthfieldptychographyusing
https://www.psi.ch/fr/psi-fellow/scientific-highlights/towards-fast-ptychography-image-reconstruction-of-euv-masks-by
In this study, we explore and demonstrate a rapid method for actinic patterned EUV mask inspection based on a deep neural network (DNN) architecture which...
image reconstructiontowardsfastptychographyeuv