Sponsor of the Day:
Jerkmate
https://www.thermofisher.com/us/en/home/electron-microscopy/products/dualbeam-fib-sem-microscopes/helios-hydra-dualbeam.html
PFIB SEM | Helios Hydra | DualBeam | Thermo Fisher Scientific - US
PFIB SEM with four different ion species (oxygen, nitrogen, xenon, argon) for optimized STEM and TEM sample preparation and 3D materials characterization.
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https://www.thermofisher.com/us/en/home/electron-microscopy/products/dualbeam-fib-sem-microscopes/helios/instruments/helios-6-hxs.html
FIB SEM | Helios 6 HXS FIB SEM | Automated Semiconductor Sample Preparation | Thermo Fisher...
The Helios 6 HXS FIB-SEM enables fully automated semiconductor sample preparation capable of producing sub-20 nm thin TEM lamella with production-grade accuracy
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https://www.thermofisher.com/us/en/home/electron-microscopy/products/dualbeam-fib-sem-microscopes/helios-5-exl-dualbeam.html
FIB SEM | Helios 5 EXL | Thermo Fisher Scientific - US
TEM sample preparation with the Helios 5 EXL Dual Beam FIB SEM is automated and wafer-based enabling the analysis of advanced 5 nm semiconductor nodes and more.
thermo fisher scientificfib semhelios5exl