https://metrology.news/new-lk-sensor-adds-surface-roughness-inspection-to-cmm-workflow/
Jul 15, 2025 - CMM sensor eliminates need for secondary surface roughness inspection, either manually or automatically at a separate metrology station.
surface roughnessnewlksensoradds
https://www.surfacemetrology.org/
WPI's Surface Metrology Laboratory Our History WPI's Surface Metrology Lab was founded over 25 years ago by Prof. Christopher Brown
surface metrologywpilaboratory