https://www.ipms.fraunhofer.de/en/press-media/press/2026/New-level-of-thin-film-characterization.html
A new level of thin-film characterization is within reach - Fraunhofer IPMS
The Fraunhofer Institute for Photonic Microsystems IPMS has launched the publicly funded SMut project, in collaboration with its partners Credoxys and SweepMe!...
thin film characterizationnew level
https://publications-cnrc.canada.ca/eng/view/object/?id=a31fbb95-60c6-44c3-adfd-f7ebd4dce978
TEM characterization of phase separation and transformation at the thin film intefaces in the...
TEM characterization of phase separation and transformation at the thin film intefaces in the SrFeO2.5+x/SiO2/Si system
https://iris.cnr.it/handle/20.500.14243/1672
Electrical characterization of porphyrin thin film towards humidity concentration
electrical characterizationthin filmporphyrintowardshumidity
https://impact.ornl.gov/en/publications/synthesis-and-characterization-of-single-wall-carbon-nanotube-amo/
Synthesis and characterization of single-wall carbon nanotube-amorphous diamond thin-film...
single wall
https://iris.cnr.it/handle/20.500.14243/34723
Syncrhronized optical and electrical characterization of discotic liquid crystal thin film
electrical characterizationliquid crystaloptical