https://meetings-archive.aps.org/tss/2010/c4/7/
Investigation of Gadolinium Gallium Oxide using spectroscopic ellipsometry - SPS Student Reception
Spectroscopic Ellipsometry (SE) is a non-destructive characterization technique used for determining film thickness, interfacial roughness and optical propertie
spectroscopic ellipsometryinvestigationgadoliniumgalliumoxide