https://www.mdpi.com/2304-6740/11/1/16
(Photo-)electrocatalytic artificial photosynthesis driven by electrical and/or solar energy that converts water (H2O) and carbon dioxide (CO2) into hydrogen...
recentadvancessitusurfaceinterface
https://www.bruker.com/en/news-and-events/webinars/2024/atomic-force-microscopy-for-advanced-surface-characterization-and-metrology-for-the-semiconductor-industry.html
Learn about Bruker's AFM-based solutions for advanced surface characterization and metrology in the semiconductor industry in our live webinar.
atomic force microscopysurface characterizationadvancedmetrology
https://www.nist.gov/publications/influence-silane-coupling-agent-composition-surface-characterization-fiber-and-fiber
Epoxy resins are widely used as the matrix material for fiber reinforced composites in aircrafts, automobiles, ships and housing.
coupling agentinfluencesilanecompositionsurface
https://www.usgs.gov/publications/characterization-post-fire-surface-cover-soils-and-burn-severity-cerro-grande-fire-new
Forest fires leave behind a changed ecosystem with a patchwork of surface cover that includes ash, charred organic matter, soils and soil minerals, and dead,...
post firesurface covercharacterizationsoilsburn
https://www.bruker.com/ko/news-and-events/webinars/2021/surface-characterization-of-thin-films-coatings-symposium-2021/watch-x9br3.html
Join our team of experts for talks and demonstrations addressing common questions and challenges faced by researchers and exploring Bruker's solutions for...
surface characterizationthin filmswatchdemandcoatings
https://www.horiba.com/bra/particlewebinars/introducing-the-magnometertm-xrs-a-new-instrument-for-particle-characterization-and-surface-analysis-of-dispersion/
Understanding the molecular structure and processes at the particle-liquid interface, from initial formulation to final manufacture, is critical to the...
new instrumentparticle characterizationintroducingmagnometerxrs
https://www.nist.gov/publications/development-surface-chemical-approaches-detection-and-characterization-multi-walled
Multi-walled carbon nanotubes (MWCNT) and other carbon nanofillers are used in different applications to enhance the materials and electrical properties of cons
developmentsurfacechemicalapproachesdetection
https://www.anton-paar.com/corp-en/services-support/webinars/detail/event/enhancing-paint-and-varnish-quality-leveraging-mechanical-surface-characterization-for-quantitative-insights-and-product-improvement/
Webinar | Enhancing Paint and Varnish Quality: Leveraging Mechanical Surface Characterization for Quantitative Insights and Product Improvement | Aug 9, 2023...
surface characterizationenhancingpaintvarnishquality
https://www.preprints.org/manuscript/202406.1645
Preventing or treating infections at implantation sites where the risk of bacterial contamination is high requires the development of intelligent drug delivery...
preparationcharacterizationoxidenanotubestitanium
https://www.bruker.com/pl/news-and-events/webinars/2021/surface-characterization-of-semiconductors-workshop.html
Discover Bruker's complete range of high-performance metrology solutions and leading-edge methods for the nanometer-scale surface characterization of...
surface characterizationsemiconductorsworkshopbruker
https://scirp.org/journal/paperinformation?paperid=37253
Discover the secrets of dragline spider silk! Explore its mechanical properties, environmental responsiveness, and chemical composition. Uncover the surface...
surface characterizationnephila clavipesspundragline
https://www.bruker.com/fr/news-and-events/webinars/2023/surface-lab-characterization-of-polymeric-materials-and-products.html
Join our on-demand webinar to explore AFM, nanoIR, and nanoindentation techniques for in-situ characterization of polymers. Tailored for materials scientists,...
polymeric materialssurfacelabcharacterizationproducts
https://www.bruker.com/zh/news-and-events/webinars/2024/atomic-force-microscopy-for-advanced-surface-characterization-and-metrology-for-the-semiconductor-industry/watch-af668.html
Learn about Bruker's AFM-based solutions for advanced surface characterization and metrology in the semiconductor industry in our live webinar.
atomic force microscopysurface characterizationdemandsessionadvanced